Root Cause Analysis
Root Cause Analysis identifies the root cause of yield problems and provides proven solutions for yield improvement. This service is unique to FCTA Mexico; no other stencil manufacturer offers this comprehensive value-added service. In combination with decades of engineering experience, we utilize proprietary analysis software that enables FCTA Mexico’s engineering team to diagnose and fix SMT yield problems anywhere in the SMT assembly process. Since the start of this service, we have performed thousands of jobs with a 98% success rate.
What do we provide?
Identify the root cause of yield problems
Accurate and thorough analysis based on assembly and process variables
Detailed and comprehensive analysis reports
Significant increases in assembly yields with specific stencil design suggestions
Areas Where Yield Problems Occur:
Thermal heat sinks
Common defects that affect yields:
Poor paste release
Bridging at reflow
Component shift and skew
Below are sample reports which will be very similar to the one you will receive regarding your process analysis. All reports contain the problem description, our Root Cause Analysis of the problem, and our custom recommendation to resolve the issue. The names have been removed to protect the identity of our clients.
Improve SMT Assembly Yields Using Root Cause Analysis in Stencil Design
Reduction of first pass defects in the SMT assembly process minimizes cost, assembly time and improves reliability. These three areas, cost, delivery, and reliability determine manufacturing yields and are key in maintaining a successful and profitable assembly process. It is commonly accepted that the solder paste printing process causes the highest percentage of yield challenges in the SMT assembly process. As form factor continues to get smaller, the challenge to obtain 100% yield becomes more difficult. This paper will identify defects affecting SMT yields in the printing process and discuss their Root Cause. Outer layer copper weight and surface treatment will also be addressed as to their effect on printability. Experiments using leadless and emerging components will be studied and root cause analysis will be presented on various common SMT defects.